Back to overview

Name:
Thin Film Metrology Seminar
Date:
Mar 01, 2012 - Mar 01, 2012
Place:
Max-Planck-Institut für Eisenforschung GmbH
Country:
Düsseldorf, Germany
Description:

Metrology

In cooperation with the Max-Planck-Institut, SENTECH organizes a seminar focusing on optical methods and applications for thin film analysis. Basics of spectroscopic ellipsometry, reflectometry, and transmission measurements will be presented.

Experts from both companies will contribute to the agenda through various presentations about the analysis of the properties of metallic surfaces, transparent conductive thin films as well as dielectric, magnetic, and organic materials.

To find the seminar program as well as the registration form, please download
SENTECH Invitation to SENTECH Seminar 1. March 2012.

For more information please do not hesitate to contact
+49 89 89796070 or sales@sentech.de.