Spectroscopic Ellipsometer SE 800 PV
Textured silicon wafers
Antireflective coatings and passivation layers can be measured on textured monocrystalline and multicrystalline silicon wafers.
Multilayer AR coatings
Coatings of SiO2 / SiNx, Al2O3 / SiNx and SiNx1 / SiNx2 can be analyzed.
Easy operation
The spectroscopic ellipsometer SE 800 PV offers easy operation for both, experts and beginners. The recipe mode
Recipe selection in SpectraRay/3
is especially suited for routine applications required in quality control.
The spectroscopic ellipsometer SE 800 PV is the ideal tool for the analysis of antireflective coatings on textured crystalline and multicrystalline silicon solar cells. Single films (SiNx, SiO2, TiO2, Al2O3) and multilayer stacks (SiO2 / SiNX, SiNx1 / SiNx2, Al2O3 / SiNx) can be measured.
The SE 800 PV is based on Step Scan Analyzer measurement mode, wide spectral range compensator, and TE cooled, high sensitive CCD based multiplex detection, dedicated to fit perfectly SENTECH’s goal of fast and accurate measurements of refractive index, absorption, and film thickness.
High measurement sensitivity, depolarization correction, and special light collecting optics make the SE 800 PV an ideal tool for photovoltaic applications on rough sample surfaces.
The spectroscopic ellipsometer SE 800 PV offers easy operation for both, experts and beginners. SpectraRay/3, SENTECH proprietary ellipsometer software, comprises two modes of operation. The recipe mode allows for easy execution of routine applications in quality control. The interactive mode with guiding graphical user interface is suited for
Moreover, the SE 800 PV fulfills all requirements of the SENresearch spectroscopic ellipsometer family.
The spectroscopic ellipsometer SE 800 PV is the ideal tool for the analysis of antireflective coatings on textured crystalline and multicrystalline silicon solar cells. Single films (SiNx, SiO2, TiO2, Al2O3) and multilayer stacks (SiO2 / SiNX, SiNx1 / SiNx2, Al2O3 / SiNx) can be measured.
The SE 800 PV is based on Step Scan Analyzer measurement mode, wide spectral range compensator, and TE cooled, high sensitive CCD based multiplex detection, dedicated to fit perfectly SENTECH’s goal of fast and accurate measurements of refractive index, absorption, and film thickness.
High measurement sensitivity, depolarization correction, and special light collecting optics make the SE 800 PV an ideal tool for photovoltaic applications on rough sample surfaces.
The spectroscopic ellipsometer SE 800 PV offers easy operation for both, experts and beginners. SpectraRay/3, SENTECH proprietary ellipsometer software, comprises two modes of operation. The recipe mode allows for easy execution of routine applications in quality control. The interactive mode with guiding graphical user interface is suited for
Moreover, the SE 800 PV fulfills all requirements of the SENresearch spectroscopic ellipsometer family.
