Product Overview:

Thin film metrology in Photovoltaics

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  • Thin film sensors
  • Reflectometer
  • Spectroscopic ellipsometer
  • Off-line / in-line / at-line
  • Large area mapping

Freiberg Instruments

Crystalline Silicon Solar Cells

Methods: laser ellipsometry, spectroscopic ellipsometry
Measurement of:   thin film thickness, refractive index
Applications: textured mono- and multicrystalline surfaces, AR antireflective coatings (SiNx, ITO, TiO2), thin passivation layers (SiO2, Al2O3), single films, double layer and multilayer stacks (SiO2 / SiNx, Al2O3 / SiNx, SiNx1 / SiNx2)

Thin Film Solar Cells

Methods: reflectometry, transmission, spectroscopic ellipsometry, 4-point probe measurement
Measurement of:   thin film thickness, refractive index, sheet resistance, spectrally resolved haze H(λ), reflection R(λ), transmission T(λ), absorption, crystallinity, band gap
Applications: thin films on large glass sheets, smooth and textured TCO films, thin CdS films, a-Si, µ-Si, CIGS, CdTe absorber films, buffer layers, complex layer stacks

Documents   To get more information, please click here.

Documents   To get more information, please click here.