SENTECH Instruments develops, manufactures, and sells worldwide advanced quality instrumentation for Plasma Etching, PECVD, Atomic Layer Deposition, Thin Film Measurement (Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Laser Ellipsometer) and Photovoltaics.
ICP-RIE Plasma Etching:
SENTECH veranstaltet ein anwendungsorientiertes Seminar zum Thema „Ellipsometrie und Reflektometrie zur Qualitätskontrolle dünner Schichten“ in Berlin-Adlershof. Das Seminar ist ausgebucht, Anmeldungen können für die darauffolgende Veranstaltung vorgenommen werden. Auch in diesem Jahr werden kompetente Referenten Ihnen an ausgewählten Beispielen die Anwendungsmöglichkeiten der optischen Messtechniken Ellipsometrie und Reflektometrie von SENTECH erläutern. →weiter
What's New?
SENTECH developed the new SenSol R2R measurement system for photovoltaics using large foil as substrate. Film thickness, optical as well as electrical properties of functional coatings can be measured on any position of the 2000 m long foils. For this purpose, transmission, reflection measurements and electrical metrology are applied. Challenging are flexibility and tension of the foil because they result in bulges and wrinkles.→read more
SENTECH took part in the world’s largest photovoltaics exhibition “SNEC”, hold from May 28-30 in Shanghai, China. Information were given about the next generation of the SENperc PV, the well-known laser ellipsometer SE 400adv PV as well as on the measurement tool SenSol for large CIGS thin film solar cells. →read more
Upcoming Events:
SENTECH
Gesellschaft für Sensortechnik mbH
Konrad-Zuse-Bogen 13
82152 Krailling / KIM
Germany
Phone: +49 (0)89 - 89 79 60 70
Fax: +49 (0)89 - 89 79 60 722
Email: sales@sentech.de
